The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
2.4 Soft Error Tolerant Reconfigurable Architecture(2. Radiation-Induced Soft Errors,<Special Survey>Dependable VLSI System)
Yukio MITSUYAMA, Takao ONOYE, Hiroyuki OCHI, Kazutoshi WAKABAYASHI
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2013 Volume 35 Issue 8 Pages 431-

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© 2013 Reliability Engineering Association of Japan
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