The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
8.2 Methods for Tampering Cryptographic LSIs(8. Security,<Special Survey>Dependable VLSI System)
Yohei HORI, Daisuke SUZUKI, Masayoshi YOSHIMURA, Masaya YOSHIKAWA, Takeshi FUJINO
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2013 Volume 35 Issue 8 Pages 492-

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© 2013 Reliability Engineering Association of Japan
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