The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
8.3 Tamper-Resistant Symmetric-Key Cryptography Circuits(8. Security,<Special Survey>Dependable VLSI System)
Mitsuru SHIOZAKI, Takeshi FUJINO, Masaya YOSHIKAWA
Author information
JOURNAL FREE ACCESS

2013 Volume 35 Issue 8 Pages 493-

Details
Download PDF (352K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© 2013 Reliability Engineering Association of Japan
Previous article Next article
Favorites & Alerts

Recently viewed articles
Share this page
feedback
 Top