The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Space Radiation Effects on Semiconductor Devices(Reliability Engineering in Astronautics)
Yoshihiro TAKAHASHI
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2014 Volume 36 Issue 8 Pages 460-467

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[in Japanese]
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© 2014 Reliability Engineering Association of Japan
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