[in Japanese]

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[in Japanese]

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[in Japanese]

View full abstract

[in Japanese]

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[in Japanese]

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[in Japanese]

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With shrinking of LSIs, the diversification of defective mode becomes a critical issue. N-detection tests have been known as an effective way for achieving high defect coverage, however the large number of test pattern counts is the problem. In this paper, we propose metrics(defect detection probability) based on the fault excitation functions to evaluate test patterns for transition faults. We also formulate the method for selecting the test patterns from the N-detection test set based on the defect detection probability as a 0-1 integer linear program. From the experimental results, we show that the set of selected test patterns can detect the larger number of fault models than the given test set with the same number of test patterns.

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