抄録
A technique of microscopic ellipsometry that measures a thickness of thin film on microareas of about 10μm∅ diameter has been developed. Application of this technique to analyze the thickness distribution of hydrated chromium oxide film on various kinds of Tin Free Steel (TFS) has shown that there are extensive differences in the uniformity of the film. It was also found that there is a good correspondence between the thickness distribution and the bond durability of side-seam cans made of TFS in retort treatment. Bond durability of TFS is already known to be affected by chromium oxide composition, including sulphate impurity and the degree of hydration. This study has revealed that the uniformity of oxide film layer is an another important factor of the bond durability of TFS.
