Journal of The Society of Instrument and Control Engineers
Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662
Ultrafast Electric Pulse Sampling Measurement Using a Scanning Force Optoelectronic Microscope (SFOEM)
Yukio KASAHARA, Akira MIZUHARA
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Keywords: SFM, optical sampling, LT-GaAs, CPS
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2002 Volume 41 Issue 4 Pages 262-268

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