Journal of The Society of Instrument and Control Engineers

Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662

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Volume 41, Issue 4

Displaying 1-11 of 11 articles from this issue

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Review of Ultrafast Electronic Measurement

Masanao MORIMURA

2002Volume 41Issue 4 Pages 252-255
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.252

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Equivalent Time Sampling Methods for a Fast Waveform Measurement

Kensuke KOBAYASHI

2002Volume 41Issue 4 Pages 256-261
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.256

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Ultrafast Electric Pulse Sampling Measurement Using a Scanning Force Optoelectronic Microscope (SFOEM)

Yukio KASAHARA, Akira MIZUHARA

2002Volume 41Issue 4 Pages 262-268
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.262

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Traceable Ultrafast Measurements at NPL

Andrew J. A. SMITH, Alan G. RODDIE, Peter D. WOOLLIAMS

2002Volume 41Issue 4 Pages 269-274
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.269

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Calibration of fast sampling oscilloscopes has become increasingly important as the technology for generating and detecting ultrafast optical and electrical pulses is incorporated into commercial telecommunication systems. This paper reviews some of the work carried out at the National Physical Laboratory for measuring ultrafast electrical pulses and describes our optoelectronic technique for calibrating the risetime of high bandwidth sampling oscilloscopes.

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Circuit and Measurement Techniques for Millimeter and Submillimeter Waves

Jongsuck BAE, Yoshihiko WAGATSUMA, Tatsuo NOZOKIDO, Koji MIZUNO

2002Volume 41Issue 4 Pages 275-280
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.275

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High Speed Scanning in AFM

Sumio HOSAKA, Atsushi KIKUKAWA, Hajime KOYANAGI, Kimitoshi ETOH

2002Volume 41Issue 4 Pages 281-286
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.281

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The Technologies for High Speed SOC Tester

Takanori KOMURO, Hiroshi SAKAYORI

2002Volume 41Issue 4 Pages 287-290
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.287

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The High Speed Technology of the Third Generation Digital Phosphor Oscilloscope

Tetsushi NAKAKADO

2002Volume 41Issue 4 Pages 291-294
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.291

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Traceable Measurements and International Comparison: 9 Electromagnetic Standards

Yasuhiko SAKAMOTO, Takeumi INOUE

2002Volume 41Issue 4 Pages 295-300
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.295

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Optical Tomography of Bio-Tissues

Takeaki YOSHIMURA

2002Volume 41Issue 4 Pages 301-307
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.301

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The 44th Japan Joint Automatic Control Conference

Toshiyuki MURAKAMI

2002Volume 41Issue 4 Pages 308
Published: April 10, 2002
Released on J-STAGE: November 26, 2009

DOIhttps://doi.org/10.11499/sicejl1962.41.308

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