Journal of The Society of Instrument and Control Engineers
Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662
The Technologies for High Speed SOC Tester
Takanori KOMURO, Hiroshi SAKAYORI
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Keywords: IC tester, interleaving, sampling, pogo pin, relay, skew
JOURNAL FREE ACCESS

2002 Volume 41 Issue 4 Pages 287-290

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