Extraction of Feature Points Suitable for Matching Image Correspondence

Yuma Kudo; Takeshi Kajiyama; Wataru Mitsuhashi

doi:10.11499/sicep.2003.0_2_2

SICE Annual Conference 2003

DOI https://doi.org/10.11499/sicep.2003.0_2_2

会議情報

主催: The Society of Instrument and Control Engineers

共催: The IEEE Industrial Electronics Society, The IEEE Robotics and Automation Society, The IEEE Control Systems Society, The IEEE Systems, Man nad Cybernetics Society, The Instrumentation, Systems, and Automation Society

Extraction of Feature Points Suitable for Matching Image Correspondence

*Yuma Kudo, Takeshi Kajiyama, Wataru Mitsuhashi

著者情報

会議録・要旨集フリー

p. 2

詳細

責任著者(Corresponding author)

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