Consideration of Optical Step Frequency Reflectometry using Band Pass Sampling

Yukitaka Shinoda; Ken Ihara; Jiro Sanada; Takashi Higo

doi:10.11499/sicep.2003.0.56.1

SICE Annual Conference 2003

DOI https://doi.org/10.11499/sicep.2003.0.56.1

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Host: The Society of Instrument and Control Engineers

Co-host: The IEEE Industrial Electronics Society, The IEEE Robotics and Automation Society, The IEEE Control Systems Society, The IEEE Systems, Man nad Cybernetics Society, The Instrumentation, Systems, and Automation Society

Consideration of Optical Step Frequency Reflectometry using Band Pass Sampling

*Yukitaka Shinoda, Ken Ihara, Jiro Sanada, Takashi Higo

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Pages 56

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