Abstract
In this paper, we propose a method to accurately measure the shape of objects by suppressing indirect reflection such as interreflection or subsurface scattering. We use a modulation with M-sequence shifted along the line of the slit light to be accurately detected on the captured image in two ways. This method has two advantages; one is the characteristics of propagation of higher spatial frequency components and the other is geometric constraint between the projector and the camera. Prior to the measurement, epipolar constraint is obtained through calibration, and then the phase consistency is evaluated to suppress the interreflection. The value of cross-correlation is used to suppress the dilation of the light caused by the subsurface scattering.
