計測自動制御学会論文集
Online ISSN : 1883-8189
Print ISSN : 0453-4654
ISSN-L : 0453-4654
レーザーを用いた粒径測定装置における散乱光強度分布から粒径分布への変換法
辰野 恭市
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ジャーナル フリー

1983 年 19 巻 10 号 p. 819-825

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抄録
The purpose of this paper is to present a new method for determining the particle size distribution from angulary scattered light intensity pattern. By the present method arbitrarily shaped particle size distribution can be obtained.
This method is a constrained inversion method of equation (1) under the following conditions: (1) n(D) is smooth and (2) n(D) is non-negative.
logI(θ)=log[∫i(D, θ)n(D)dD] (1)
I(θ): scattered light intensity pattern.
n(D): particle size distribution
i(D, θ): Mie scattering function Equation (1) is approximated by linear equations (I=G·n). The least square solution of its equations is obtained using Lagrange's method of indeterminate coefficients and KuhnTucker's theorem. In Lagrange's method Lagrangian multiplier γ must be selected. It is shown that geometrical mean value of G*G's eigenvalues is suitable for Lagrangian multiplier γ.
Numerical experiments are performed to verify the effectiveness of constraint conditions and the validity of γ selection. Several particle size distributions are inverted from measured light intensity patterns scattering by Polystyrene particles whose diameters are known to verify the applicability of the present method.
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