Abstract
This paper proposes a new method of compact and efficient logic testing of a circuit, which we call here MSEC method. In this MSEC method, an M-sequence is applied to a logic circuit under test and the crosscorrelation function between the input and the output are calculated for several delays. The crosscorrelation functions are then compared with the correct values, and if they are different, we can guess that there must be some faults in the circuit. It is theoretically shown that MSEC method has a very small probability that we miss any faults.
The results of computer simulation agree well with the theoretical considerations.
