Abstract
This paper deals with detection of pattern-sensitive faults in Random-Access Memories (RAM) using pseudorandom M-sequences. Two types of neighborhood around each cell are considered and two schemes for fault detection are proposed by appropriately choosing the test-sequences depending on the neighborhood. The conditions to obtain complete test-set and the nature of the test-patterns are analyzed. Due to the random nature of the test-patterns, it was found out that the schemes not only cover pattern-sensitive faults, but also cover decoder faults to a large extent. The effectiveness of the test sequences to some common fault types is analyzed in comparison to conventional schemes.
