Abstract
We studied the polarization characteristics on emissivity of metal during oxidation process theoretically and experimentally. In this process, the emissivity widely changes with increasing oxidation due to the interference effect of radiation between the metal surface and the oxidation film. As a result, we found that p-polarized and s-polarized emissivities, εp, and εs, of real metal surface behave with different manner and its ratio, Rps, depends strongly on the thickness of the oxidation film. On this basis, we offered the emissivity-compensated radiation thermometry. In this paper, we discussed applicable fields and limitations of the method, and some items to solve for the further development on this study.
