Author's Organization:Particle Metrology Section, Nanomaterial Characterization Division, National Metrology Institute of Japan (NMIJ)National Institute of Advanced Industrial Science and Technology (AIST
Published: February 10, 2015Received: October 01, 2014Released on J-STAGE: October 06, 2016Accepted: January 06, 2015
Advance online publication: -
Revised: -