Journal of the Society of Powder Technology, Japan
Online ISSN : 1883-7239
Print ISSN : 0386-6157
ISSN-L : 0386-6157
Manipulation and Fixation of Fine Particles Using Probes
Mitsuru EgashiraTakeshi KonnoMikihiko Kobayashi
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2006 Volume 43 Issue 12 Pages 897-905

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Abstract
A monopole probe and a dipole probe are introduced for one-by-one manipulation of fine particles. The holding force of a particle is controlled by an external power supply. The monopole probe is a tungsten needle, and it can manipulate conducting particles on a metal substrate by applying voltage between the probe and the substrate. It is also capable of welding metal particles on the substrate using it as an electrode. The dipole probe consists of two electrodes, and traps fine particles for any combination of materials of particle and substrate. Both probes can manipulate particles larger than 30μm, which cannot be done by the conventional needle-like probes.
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