Abstract of annual meeting of the Surface Science of Japan
25th annual meeting of the Surface Science Society of Japan
Session ID : P30
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Host: The Surface Science Society of Japan

November 17
Sputter depth profiling of organic devices using C60 ion beam
*Takuya Miyayama, Noriaki Sanada, Risayo Inoue, Noriko Iida, John S. Hammond, Masahiro Kudo
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[in Japanese]
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© 2005 The Surface Science Society of Japan
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