Abstract of annual meeting of the Surface Science of Japan
31st annual meeting of the Surface Science Society of Japan
Session ID : 17Bp-08
Conference information

Host: The Surface Science Society of Japan

December17
Verification of Fe-induced negative charge in thermally oxidized Si(100) wafers on the basis of frequency dependent AC surface photovoltage method
*Hiroyuki Hagiwara, Satoru Katou, Hirofumi Shimizu
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Download PDF (186K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract
[in Japanese]
Content from these authors
© 2011 The Surface Science Society of Japan
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Abstract of annual meeting of the Surface Science of Japan

Successor

Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science

Share this page
feedback
 Top