Abstract of annual meeting of the Surface Science of Japan
32st annual meeting of the Surface Science Society of Japan
Session ID : 20Cp06R
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Host: The Surface Science Society of Japan

November20
Standardization and database construction of electron-induced damage of sample in AES -SiO2 surface-
*Takaharu Nagatomi, Shigeo Tanuma
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2012 The Surface Science Society of Japan
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