2015 International Joint Symposium on Recent Progress of Advanced Nanocharacterization
Session ID : 2P21S
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Host: The Surface Science Society of Japan, The Vacuum Society of Japan
december2
Cross-sectional STM/STS Measurements for Cleaved MIS-Si(111) Surfaces with Applied Gate-bias Voltages.
*Yuri Ishihara, Naoya Kato, Kazuya Tachibana, Nozomu Hirota, Ken Hattori, Hiroshi Daimon, Tingting Wei, Kohei Fujiwara, Azusa Hattori, Hidekazu Tanaka
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