Abstract of annual meeting of the Surface Science of Japan
2015 International Joint Symposium on Recent Progress of Advanced Nanocharacterization
Session ID : 1Da03
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Host: The Surface Science Society of Japan, The Vacuum Society of Japan

december1
Analysis of X-ray induced force components in force spectra obtained by X-ray aided NC-AFM(XANAM)
*Shushi Suzuki, Shingo Mukai, Wang-Jae Chun, Masaharu Nomura, Kiyotaka Asakura
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[in Japanese]

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© 2015 The Surface Science Society of Japan
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