Abstract of annual meeting of the Surface Science of Japan
2015 International Joint Symposium on Recent Progress of Advanced Nanocharacterization
Session ID : 1Da03
Conference information

Host: The Surface Science Society of Japan, The Vacuum Society of Japan

december1
Analysis of X-ray induced force components in force spectra obtained by X-ray aided NC-AFM(XANAM)
*Shushi Suzuki, Shingo Mukai, Wang-Jae Chun, Masaharu Nomura, Kiyotaka Asakura
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Download PDF (284K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract
[in Japanese]
Content from these authors
© 2015 The Surface Science Society of Japan
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Abstract of annual meeting of the Surface Science of Japan

Successor

Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science

Share this page
feedback
 Top