Joint Symposium of the Surface Sience Society of Japan and the Vacuum Society of Japan
Session ID : 2PB34
Conference information
Host:
The Surface Science Society of Japan
Name :
2016 International Joint Symposium on Recent Progress of Advanced Nanocharacterization
Location :
[in Japanese]
Date :
November 29, 2016 - December 01, 2016
Background optimization of an Auger spectrum excited by an external electron beam