X線ディフラクトメーターにおける炭素材料の吸収因子
2007 年 2007 巻 227 号 p. 93-102
詳細
2007 年 2007 巻 227 号 p. 93-102
The absorption factor for carbon materials, one of very weakly absorbing materials, was investigated with a simple assumption that the cross section of the incident X-ray beam with a rectangle of a height (h) and breadth (br) to the flat sample was kept for the scattered X-ray beam. For calculation, in both of the reflection and transmission methods of diffraction measurements, the divergence angles of the divergence slit β and scatter slit γ were considered in two cases with β<<γ and β= γ. For the case β<<γ, all of the scattered beam could be determined with the detector. The following results were obtained.
a) Reflection method
b) Transmission method
where A (θ) is the absorption factor at glancing angle θ, br=Rsinβ, R is the radius of the goniometer, , μ' is the apparent absorption coefficient of the sampleand t is the thickness of the sample. Influence of the absorption factor on intensity recording of the 002 diffraction was examined for the powder samples contained in a glass holder of 0.2 mm depth, assuming the intensity could be expressed by Gaussian functions. The influence could be significant for the intensity recording when the full width at the half maximum for the intensity plotted against 2θ exceeds 3°.
