Development of a Support System for Radiation Resistance Testing

抄録

In recent years, consumer parts have been used in nano satellites or small satellites. Radiation resistance testing is a useful method of evaluating operational stability in the space environment. Since the single event effect (SEE) is a probabilistic phenomenon, it is necessary to monitor the test pieces at all times during the radiation test. If response to a serious error such as SEL is delayed, the test pieces may be damaged or broken, and the accuracy of the test result may be reduced. In this research, a test support system that can instantly detect the occurrence of an SEE and respond automatically was developed in order to improve the efficiency and accuracy of radiation tests. Radiation resistance tests for consumer microcomputers and communication module were conducted using the test support system. From the test results, the effectiveness of the test support system and improvement points were confirmed, and the possibility of space application of consumer microcomputers and communication module were evaluated.