鉄と鋼
Online ISSN : 1883-2954
Print ISSN : 0021-1575
ISSN-L : 0021-1575
論文
XAFSによる微粒子の化学状態分析
松本 諭石井 秀司田辺 晃生河合 潤
著者情報
ジャーナル オープンアクセス

2007 年 93 巻 2 号 p. 132-137

詳細
抄録
The measurement of X-ray absorption fine structure (XAFS) spectra of fine particle samples using the total electron yield and X-ray fluorescence yield methods reveals the chemical state of surface and bulk, separately, of powder samples. For various particulate environmental samples (both standard samples and sampled in the fields) are measured and the chemical state analysis of sulphur has been performed in the present study. The difference among the samples collected at a same place/date and the similarity among the samples collected at the different places/date are discussed from the view point of the error introduced in the present experiment.
著者関連情報
© 2007 一般社団法人 日本鉄鋼協会

This article is licensed under a Creative Commons [Attribution-NonCommercial-NoDerivatives 4.0 International] license.
https://creativecommons.org/licenses/by-nc-nd/4.0/
前の記事 次の記事
feedback
Top