The CZTS thin film was immersed in sulfuric acid with iron nitrate (III) nonahydrate. Samples were evaluated by Raman scattering spectroscopy, SEM and EDX. The normalized film thickness decreased with increasing in concentsation of Fe(NO3)3・9H2O. Therefore, sulfuric acid with Fe(NO3)3・9H2O is one of the etchants for CZTS materials.
