Zn系半導体ナノ粒子多積層膜の屈折率に及ぼすナノ粒子サイズの影響

抄録

The thin films were prepared by layer-by-layer deposition of ZnS and ZnSe nanoparticles on glass substrates. The thickness and optical constants of the prepared thin films were determined by spectroscopic ellipsometry. We demonstrate the applicability of multi-layered semiconductor nanoparticles as a material for optical thin films.