抄録
The giant magnetoresistive (GMR) recording head is extremely sensitive to external magnetic field. Since it is anano-scale electronic device, various unpredictableeffects, i.e., electrostatic discharge (ESD) and parametric effects, exhibit. It has been found that a d. c. voltage of an order of about 1 V across the head is harmful. In this report, the effect of magnetic field radiated by an electromagnetic interference, EMI, phenomena in aspin-stand recording head tester is studied. It is seen fromresults that the field strength produced by a reverse biasheadset is about twice higher than that by a forward biasheadset. This is possibly due to the remanence in magneticelements or even in the headset itself. It is also found froman estimated calculation that EMI may induce the voltagedrop across GMR head as highly as about 35 m V which ispossibly strong enough to interfere the head performance.
