2014 年 39 巻 4 号 p. 443-446
To analyze carrier behaviors leading to electroluminescence (EL) of double-layer organic light-emitting diodes (OLEDs), we used a novel microscopic electric-field-induced optical second-harmonic generation measurement system equipped with a radially polarized pulsed laser beam, which can probe two-dimensional electric field distributions in OLEDs. We showed a relationship between EL emission distribution and interfacial accumulated charge distribution.