抄録
To reduce the inaccuracy caused by inappropriate time window, we propose two probabilistic fault localization schemes based on the idea of “extending time window.” The global window extension algorithm (GWE) uses a window extension strategy for all candidate faults, while the on-demand window extension algorithm (OWE) uses the extended window only for a small set of faults when necessary. Both algorithms can increase the metric values of actual faults and thus improve the accuracy of fault localization. Simulation results show that both schemes perform better than existing algorithms. Furthermore, OWE performs better than GWE at the cost of a bit more computing time.
