Modeling of Transfer Impedance in Automotive BCI Test System with Closed-loop Method

抄録

This paper presents a methodology with which to construct an equivalent simulation model of closed-loop BCI testing for a vehicle component. The proposed model comprehensively takes the transfer impedance of the test configuration into account. The methodology used in this paper relies on circuit modeling and EM modeling as well. The BCI test probes are modeled as the equivalent circuits, and the frequency-dependent losses characteristics in the probe's ferrite are derived using a PSO algorithm. The measurement environments involving the harness cable, load simulator, DUT, and ground plane are designed through three-dimensional EM simulation. The developed circuit model and EM model are completely integrated in a commercial EM simulation tool, EMC Studio of EMCoS Ltd. The simulated results are validated through comparison with measurements. The simulated and measurement results are consistent in the range of 1MHz up to 400 MHz.