Signal Selection Methods for Debugging Gate-Level Sequential Circuits

抄録

This paper introduces methods to modify a buggy sequential gate-level circuit to conform to the specification. In order to preserve the optimization efforts, the modifications should be as small as possible. Assuming that the locations to be modified are given, our proposed method finds an appropriate set of fan-in signals for the patch function of those locations by iteratively calculating the state correspondence between the specification and the buggy circuit and applying a method for debugging combinational circuits. The experiments are conducted on ITC99 benchmark circuits, and it is shown that our proposed method can work when there are at most 30,000 corresponding reachable state pairs between two circuits. Moreover, a heuristic method using the information of data-path FFs is proposed, which can find a correct set of fan-ins for all the benchmark circuits within practical time.