IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on VLSI Design and CAD Algorithms
Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
Takashi IMAGAWAMasayuki HIROMOTOHiroyuki OCHITakashi SATO
著者情報
キーワード: soft error, TMR, reliability, methodology
ジャーナル 認証あり

2010 年 E93.A 巻 12 号 p. 2524-2532

詳細
抄録
This paper proposes a reliability evaluation environment for coarse-grained reconfigurable architectures. This environment is designed so that it can be easily extended to different target architectures and applications by automating the generation of the simulation inputs such as HDL codes for fault injection and configuration information. This automation enables us to explore a huge design space in order to efficiently analyze area/reliability trade-offs and find the best solution. This paper also shows demonstrative examples of the design space exploration of coarse-grained reconfigurable architectures using the proposed environment. Through the demonstrations, we discuss relationship between coarse-grained architectures and reliability, which has not yet been addressed in existing literatures and show the feasibility of the proposed environment.
著者関連情報
© 2010 The Institute of Electronics, Information and Communication Engineers
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