Fault-Injection Analysis to Estimate SEU Failure in Time by Using Frame-Based Partial Reconfiguration

抄録

SRAM-based field programmable gate arrays (FPGAs) are vulnerable to a soft-error induced by radiation. Techniques for designing dependable circuits, such as triple modular redundancy (TMR) with scrubbing, have been studied extensively. However, currently available evaluation techniques that can be used to check the dependability of these circuits are inadequate. Further, their results are restrictive because they do not represent the result in terms of general reliability indicator to decide whether the circuit is dependable. In this paper, we propose an evaluation method that provides results in terms of the realistic failure in time (FIT) by using reconfiguration-based fault-injection analysis. Current fault-injection analyses do not consider fault accumulation, and hence, they are not suitable for evaluating the dependability of a circuit such as a TMR circuit. Therefore, we configure an evaluation system that can handle fault-accumulation by using frame-based partial reconfiguration and the bootstrap method. By using the proposed method, we successfully evaluated a TMR circuit and could discuss the result in terms of realistic FIT data. Our method can evaluate the dependability of an actual system, and help with the tuning and selection in dependable system design.