抄録
Novel deterministic digital calibration of pipelined ADC has been proposed and analyzed theoretically. Each MDAC is dithered exploiting its inherent redundancy during the calibration. The dither enables fast accurate convergence of calibration without requiring any accurate reference signal and hence with minimum area and power overhead. The proposed calibration can be applied to both the 1.5-bit/stage MDAC and the multi-bit/stage MDAC. Due to its simple structure and algorithm, it can be modified to the background calibration easily. The effectiveness of the proposed calibration has been confirmed by both the extensive simulations and the measurement of the prototype 0.13-µm-CMOS 50-MS/s pipelined ADC using the op-amps with only 37-dB gain. As expected, SNDR and SFDR have improved from 35.5dB to 58.1dB and from 37.4dB to 70.4dB, respectively by the proposed calibration.
