F-Scan: A DFT Method for Functional Scan at RTL

抄録

Due to the difficulty of test pattern generation for sequential circuits, several design-for-testability (DFT) approaches have been proposed. An improvement to these current approaches is needed to cater to the requirements of today's more complicated chips. This paper introduces a new DFT method applicable to high-level description of circuits, which optimally utilizes existing functional elements and paths for test. This technique, called F-scan, effectively reduces the hardware overhead due to test without compromising fault coverage. Test application time is also kept at the minimum. The comparison of F-scan with the performance of gate-level full scan design is shown through the experimental results.