Tohoku-Section Joint Convention Record of Institutes of Electrical and Information Engineers, Japan
[volume title in Japanese]
Session ID : 2A14
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Host: IEEE SENDAI SECTION

Impact of Parasitic Delay in Sub-100nm-Gate In0.7Ga0.3As HEMTs
*[in Japanese], [in Japanese], [in Japanese], Dae-Hyun Kim, Jesus A. del Alamo
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© 2008 Organizing Committee of Tohoku-Section Joint Convention of Institutes of Electrical and Information Engineers, Japan
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