1991 Volume 15 Issue 9 Pages 37-42
Many FETs used at the radio transmitter of NHK Murasumi Radio Transmitting Station were damaged by lightning in 1989. The major causes of damaging FETs are transient voitage and current due to load change and induced surge voltage by lightning. Described are an analysis of transient voitage and current and some effective measures to protect madium-wave radio transmitter from lightning.