CCD基本特性シミュレータによるデバイス設計
1996 年 20 巻 23 号 p. 31-36
詳細
1996 年 20 巻 23 号 p. 31-36
An automatic simulation system has been developed which analyzes automatically basic electric characteristics of CCD image sensor from a process simulation result. High performance cell technology has been developed by using this system in shorter development period. CCD's dynamic range has been achieved 1.8 times in comparison with the conventional technology. And simulation period has been shortened to about 1/10 to gat rid of complicated repetitious procedures.
