Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1910
Print ISSN : 1348-8236
2E1-1 Machine learning assisted characterization of submicron-sized failures in 3D interconnect technologies utilizing scanning acoustic microscopy
Priya Paulachan, Ingo Wiesler, Tatjana Djuric-Rissner, Peter Czurratis, Rol Brunner
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2024 Volume 45 Pages 78-

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