X-ray absorption fine structure (XAFS) spectroscopy is widely used in various fields in earth sciences. The measurement of the spectra can be conducted both in transmission and fluorescence modes. Accurate and precise XAFS spectra should be obtained for the determination of the local structure and chemical species of a target element. In this manuscript, hole effect, thickness effect, and other related problems in the XAFS analysis were explained to measure correct XAFS spectra within a limited time, because most of XAFS spectra are measured in synchrotron radiation facilities.
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