Si is a promising candidate for environmentally friendly thermoelectric (TE) material because of its non-toxicity
and abundance. However, the lattice thermal conductivity of Si is extremely high, leading to low dimensionless figure of merit
ZT. In a previous study, Xie et al. succeeded in reducing lattice thermal conductivity and improving
ZT (0.39 at 1073 K) by forming dense dislocations in CoSi
2/Si composite. These dislocations were automatically introduced into Si matrix by sintering melt-spun powders. The formation mechanism of the dislocations is considered to be related to the eutectic reaction between CoSi
2 and Si. In this study, we applied the same process to Cr-Si system, which has similar eutectic temperature and eutectic composition to Co-Si system, intending to get insight into the formation mechanism of the dislocations. P-doped n-type Si and CrSi
2 nanocomposites were synthesized by melt spinning followed by spark plasma sintering. Transmission electron microscope observation showed that there were dislocations in Si matrix that seems to be formed by the same mechanism with CoSi
2/Si. Owing to the reduced lattice thermal conductivity, the maximum
ZT reached 0.37 at 1073 K. This result indicates that a eutectic reaction plays an important role in the formation of the dislocations.
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