It would be possible to understand the mechanism for forming a compressive residual stress field around the crack tip by measuring the stress directly. It would also be possible to contribute to the construction of a crack growth model that enables us to explain a retardation effect on crack growth. In this study, the process of the forming a compressive residual stress field around the crack tip caused by overloading was examined using the X-ray diffraction method. In order to examine the effect of overloading, the stress intensity factor of 30MPa√m was applied to the specimen, which K=25MPa√m had been applied. The measured stress near the crack tip after the overloading was reduced to by 23-44% in comparison with before the overloading was applied. Through this experimental approach, a formation of the compressive residual stress field around the crack tip as well as the effect of the overloading on a stress reduction was revealed.