Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2010 Fall Meeting
Session ID : O07
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Characterization Measurement of 12inch NTD Silicon in JRR-4
*Jun Motohashi, Masahiro Yagi, Toshiaki Kishi, Takanori Kashimura
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Keywords: Silicon Doping, Characterization Measurement, JRR-4
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[in Japanese]
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© 2010 Atomic Energy Society of Japan
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