A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle

Abstract

Numerical simulations of X-ray absorption near edge structure (XANES) of Au L₃-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state. The results of calculations show that the signal to background ratio (S/B) of XANES at incidence angle of 4mrad is greater than that at incidence angle of 12mrad. Experimental results are in agreement with numerical simulations.