Abstract
Since 1970, the author has demonstrated the usefulness of the specular reflection method for in situ analysis of adsorbed species on solid electrode/solution interfaces. Although many sophisticated optical techniques have been developed for this purpose in recent years, this method is still valuable for studying adsorption, owing to its sensitivity and specificity for detecting trace amounts of adsorbed species on the electrode surfaces under actual electrochemical conditions. This review is concerned with the application of the specular reflection method to the observation of oxide layer formation, inorganic and organic adsorption phenomena, and surface corrosion on metal electrodes.
