日本人EFL小学生用のリスニングスパンテストの開発

抄録

　　Working memory (WM), which can be conceptualized as a central executive function with a phonological loop subsystem, plays an important role in language processing. A listening span test (LST) has been used to measure the central executive function required for both processing and retention of spoken language. Many previous studies have reported that scores on second language (L2) and first language (L1) LSTs were correlated with success in language acquisition and development in L1 and L2. However, no L2 LST has been developed for Japanese elementary school (ES) students, whereas some L2 LSTs have been developed for university students and adults. This study developed and validated an L2 English LST for Japanese ES students considering the educational environment of Japanese ES students. A total of 53 Japanese fifth-grade students took part in the validation study. They took a Japanese LST, the newly developed English LST, and an English listening proficiency test. The results showed that scores on the English LST were correlated with those for the Japanese LST and the English listening proficiency test. Furthermore, performance on the English LST was predicted by the Japanese LST when the effect of English listening proficiency was excluded. Therefore, the L2 English LST is valid in that it measures the central executive function during L2 listening comprehension.