抄録
The effect of the grain boundary of ice crystals in a frozen gelatin solution on the dielectric properties was investigated by the combination of a dielectric spectrometer and image analysis. A micro-slicer image processing system (MSIPS) was applied to measure the grain boundary properties as the perimeter density and number density of ice crystals. The perimeter density and number density of the ice crystals increased with increasing freezing rate. The dielectric properties of the frozen gelatin solution at various freezing rates were measured in the frequency range of 100 Hz to 100 kHz at −40 °C. The relaxation time did not affect the grain boundary properties. The perimeter density and number density significantly affected dielectric parameter ε0−ε∞ and electrical conductivity σ0. These results indicate that the dielectric spectrometer could be used to estimate the grain boundary properties in a frozen gelatin solution.
